BS EN 62258-1-2010 半导体压模产品.采购和使用
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【英文标准名称】:Semiconductordieproducts.Procurementanduse
【原文标准名称】:半导体压模产品.采购和使用
【标准号】:BSEN62258-1-2010
【标准状态】:现行
【国别】:英国
【发布日期】:2010-11-30
【实施或试行日期】:2010-11-30
【发布单位】:英国标准学会(GB-BSI)
【起草单位】:BSI
【标准类型】:()
【标准水平】:()
【中文主题词】:组装件;芯片;组件;连接件;定义(术语);交付;电气工程;电学测量;电子工程;电子设备及元件;环境测试;集成电路;材料;机械测试;采购;半导体器件;半导体;规范(验收);试验;薄片
【英文主题词】:Assemblies;Chips;Components;Connections;Definitions;Delivery;Electricalengineering;Electricalmeasurement;Electronicengineering;Electronicequipmentandcomponents;Environmentaltesting;Integratedcircuits;Materials;Mechanicaltesting;Procurements;Semiconductordevices;Semiconductors;Specification(approval);Testing;Wafers
【摘要】:ThispartofIEC62258hasbeendevelopedtofacilitatetheproduction,supplyanduseofsemiconductordieproducts,including?wafers,?singulatedbaredie,?dieandwaferswithattachedconnectionstructures,?minimallyorpartiallyencapsulateddieandwafers.Thestandarddefinestheminimumrequirementsforthedatathatareneededtodescribesuchdieproductsandisintendedasanaidtothedesignofandprocurementforassembliesincorporatingdieproducts.Itcoverstherequirementsfordata,including?productidentity?productdata?diemechanicalinformation?test,quality,assemblyandreliabilityinformation?handling,shippingandstorageinformationItcoversthespecificrequirementsforthedatathatareneededtodescribethegeometricalpropertiesofdie,theirphysicalpropertiesandthemeansofconnectionnecessaryfortheiruseinthedevelopmentandmanufactureofproducts.Italsocontains,intheannexes,avocabularyandlistofcommonacronyms.
【中国标准分类号】:L40
【国际标准分类号】:31_080_01;31_080_99
【页数】:48P;A4
【正文语种】:英语
【原文标准名称】:半导体压模产品.采购和使用
【标准号】:BSEN62258-1-2010
【标准状态】:现行
【国别】:英国
【发布日期】:2010-11-30
【实施或试行日期】:2010-11-30
【发布单位】:英国标准学会(GB-BSI)
【起草单位】:BSI
【标准类型】:()
【标准水平】:()
【中文主题词】:组装件;芯片;组件;连接件;定义(术语);交付;电气工程;电学测量;电子工程;电子设备及元件;环境测试;集成电路;材料;机械测试;采购;半导体器件;半导体;规范(验收);试验;薄片
【英文主题词】:Assemblies;Chips;Components;Connections;Definitions;Delivery;Electricalengineering;Electricalmeasurement;Electronicengineering;Electronicequipmentandcomponents;Environmentaltesting;Integratedcircuits;Materials;Mechanicaltesting;Procurements;Semiconductordevices;Semiconductors;Specification(approval);Testing;Wafers
【摘要】:ThispartofIEC62258hasbeendevelopedtofacilitatetheproduction,supplyanduseofsemiconductordieproducts,including?wafers,?singulatedbaredie,?dieandwaferswithattachedconnectionstructures,?minimallyorpartiallyencapsulateddieandwafers.Thestandarddefinestheminimumrequirementsforthedatathatareneededtodescribesuchdieproductsandisintendedasanaidtothedesignofandprocurementforassembliesincorporatingdieproducts.Itcoverstherequirementsfordata,including?productidentity?productdata?diemechanicalinformation?test,quality,assemblyandreliabilityinformation?handling,shippingandstorageinformationItcoversthespecificrequirementsforthedatathatareneededtodescribethegeometricalpropertiesofdie,theirphysicalpropertiesandthemeansofconnectionnecessaryfortheiruseinthedevelopmentandmanufactureofproducts.Italsocontains,intheannexes,avocabularyandlistofcommonacronyms.
【中国标准分类号】:L40
【国际标准分类号】:31_080_01;31_080_99
【页数】:48P;A4
【正文语种】:英语
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